SXM 2 Workshop, Vienna, Austria, 16-18 September 1996FRIEDBACHER, Gernot.Surface and interface analysis. 1997, Vol 25, Num 7-8, issn 0142-2421, 147 p.Conference Proceedings

AFM and STM characterization of TiO₂-ultrafiltration membranesBEYER, D; RICHTER, H; TOMANDL, G et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 593-595, issn 0142-2421Conference Paper

Spectroscopic contrast by colour photon scanning tunnelling microscopyBRÜCKL, H; KINSKI, J; SOTNIK, N et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 496-499, issn 0142-2421Conference Paper

Nucleic acid organizations visualized by scanning force microscopyBOHLEY, C; MATERN, D; BISCHOFF, G et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 614-619, issn 0142-2421Conference Paper

STM-induced annealing and nanoextrusion in nm-period multilayersGORBUNOV, A. A; RICHTER, J; POMPE, W et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 596-605, issn 0142-2421Conference Paper

Computer simulation of the AFM/LFM imaging process: Hexagonal versus honeycomb structure on graphiteVON TOUSSAINT, U; SCHIMMEL, T; KÜPPERS, J et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 620-625, issn 0142-2421Conference Paper

Morphology and in situ deformation of polyamide films investigated with scanning force microscopyDRECHSLER, D; KARBACH, A; FUCHS, H et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 537-542, issn 0142-2421Conference Paper

Investigation of electrical double layers on SiO₂ surfaces by means of force vs. distance measurementsHÜTTL, G; BEYER, D; MÜLLER, E et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 543-547, issn 0142-2421Conference Paper

Observation of Coulomb blockade effects in AFM-machined tunnel junctionsBRÜCKL, H; RANK, R; VINZELBERG, H et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 611-613, issn 0142-2421Conference Paper

Scanning acoustic force microscope investigations of surface acoustic wavesHESJEDAL, T; CHILLA, E; FRÖHLICH, H.-J et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 569-572, issn 0142-2421Conference Paper

Scanning force microscopy and geometric analysis of two-dimensional collagen network formationMERTIG, M; THIELE, U; BRADT, J et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 514-521, issn 0142-2421Conference Paper

AFM characterization of Ta-based diffusion barriers for use in future semiconductor metallizationFISCHER, D; MEISSNER, O; BENDJUS, B et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 522-528, issn 0142-2421Conference Paper

Scanning near-field optical microscope: a method for investigating chromosomesWIEGRÄBE, W; MONAJEMBASHI, S; DITTMAR, H et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 510-513, issn 0142-2421Conference Paper

3D calibration of a scanning force microscope with internal laser interferometersBIENIAS, M; GAO, S; HASCHE, K et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 606-610, issn 0142-2421Conference Paper

Study of polycrystalline and amorphous LPCVD silicon films by atomic force microscopyPLESCHINGER, A; LUTZ, J; KUCHAR, F et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 529-532, issn 0142-2421Conference Paper

Near-field optical spectroscopy of single GaAs quantum wiresRICHTER, A; SÜPTITZ, M; LIENAU, C et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 583-592, issn 0142-2421Conference Paper

Detection and momentum spectrometry of single microparticles by scanning force microscopy sensorsWURSTER, R.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 505-509, issn 0142-2421Conference Paper

Focusing of laser radiation in the near-field of a tip (FOLANT) for applications in nanostructuringDICKMANN, K; JERSCH, J; DEMMING, F et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 500-504, issn 0142-2421Conference Paper

Fractal dimension of thin-film surfaces obtained by Fourier spectral analysisZAHN, W; ZÖSCH, A.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 488-491, issn 0142-2421Conference Paper

Scanning near-field magneto-optic microscopy: Quantitative measurements of local Faraday effectsEGGERS, G; ROSENBERGER, A; HELD, N et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 483-487, issn 0142-2421Conference Paper

Application of a near-field optical microscope to investigate the fluorescence energy transfer between chromophores embedded in Langmuir-Blodgett filmsBRUNNER, R; BIETSCH, A; HOLLRICHER, O et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 492-495, issn 0142-2421Conference Paper

Waveguide effect on the image formation process in near-field photocurrent spectroscopy of semiconductor laser diodesRICHTER, A; LIENAU, C; TOMM, J. W et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 573-582, issn 0142-2421Conference Paper

A novel method for time-resolved characterization of micromagnetic stray fields with scanning probe microscopyBANGERT, J; KASIM, S; MERTIN, W et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 533-536, issn 0142-2421Conference Paper

Comparative morphology study of indentations in quasicrystalline AlPdMn and single-crystalline NiAl investigated by atomic force microscopyWOLF, B; DEUS, C; PAUFLER, P et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 561-568, issn 0142-2421Conference Paper

Multi-method analysis of the metal/electrolyte interface: Scanning force microscopy (SFM), quartz microbalance measurements (QMB), Fourier transform infrared spectroscopy (FTIR) and grazing incidence X-ray diffractometry (GIXD) at a polycrystalline copper electrodeKAUTEK, W; GEUSS, M; SAHRE, M et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 548-560, issn 0142-2421Conference Paper